16 OCV Myths

16 Myths About Variations

Dr. Alexander Tetelbaum

12 Initial Myths, February 10, 2012

4 More Myths, October 1, 2012

 

“… As we know, there are known knowns; there are things we know we know.

We also know there are known unknowns; that is to say we know there are some things we do not know.

But there are also unknown unknowns – the ones we don’t know we don’t know.”

- Donald Rumsfeld,
Former US Defense Secretary

 

Abstract. This presentation discusses 16 myths about global and local variations including process, voltage, temperature, interconnect, how local or On-Chip-Variation (OCV) margins (timing derates) can be justified, how OCV margin impact design performance and cost, and what are safe OCV margins. Questions are raised about trends in variations, delay sensitivity to variations, multiple sources of variations and either SSTA or AOCV tools/features can solve the existing problems in timing derating.

Two main conclusions are:

(1) Current STAs and OCV/AOCV/POCV derating do not guarantee silicon robustness even though
(2) Most paths will have excessive derating that hurts performance, design cost, and TTM

 

 

————————————————————————————————————–
Past successful signoff with using not advanced STA and SSTA tools is no guarantee of future results & a risk of silicon failure is involved.
Copyright © 2012-2013 Abelite Design Automation, Inc. All Rights Reserved.
——————————————————————————————————————
Back to Main Page

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

——————————————————————————————————

Do not click the link below…..